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2015-05-18 CoreTech &Ulvac-Phi congratulate to the success of 2015 China National Surface Analysis Conference Grand Opening

CoreTech & Ulvac-Phi congratulate to the success of 2015 China National Surface Analysis Conference Grand Opening

18-May-2015

 

Surface Analysis technique had be rapidly growing in China for the past 20+ years.  It had highly contributed into the growth for the Universities research studies as well as to the industrial products development.  Since year 2012, China National Surface Analysis Conference had been organized at Tsinghua University and Sichuan Univeristy with great success.  This year, the Conference is held in the city of Ningbo from May-14 to May-17, 2015.

 

During the conference, the host from Ningbo Institute of Industrial Technology CAS Dr. Li Run-Wei had made an opening speech for welcoming all the participants.  After that, Professor Zhu Yong-Fa had re-emphasize the theme of every year conference is mainly in purpose for providing an open sharing platform for the public so does not matter if for the users or even instrument manufacturers, everyone should make use of this platform to make positive contribution to the Surface Analysis society.  CoreTech & Ulvac-Phi both very much agreed to this thinking concept, and hence very proudly to be the sponsor for this conference for the past consecutive 4 years.  CoreTech, as being "PHI in China", will continue to partner with Ulvac-Phi to provide the best Surface Analysis instrument and hereafter the best after-sale service to the China users.

 

In this year conference, there are more than 80 participants.  In total, 31 presentation talks were being given including invited speakers from National University of Singapore Prof. Chen Wei and Xu-Chang University Prof. Zheng Zi.  From CoreTech, Ms. Lucy Lu had presented on the Material applications using AES & Tof-SIMS.  Representing from Ulvac-Phi, Mr. Takuji Shibasaki had introduced the failure analysis of electronic devices using scanning XPS microprobe with AES.  After 2 days of busy but fruitful meeting, together with the highly participation from the attendants, 2015 Ningbo China National Surface Analysis Conference had been successfully completed, and let us look forward to conference in 2016 again.

 

 Conference venue

 

 CoreTech & Ulvac-Phi setting up a booth at the conference and presented the newest Surface Analysis technologies from Ulvac-Phi

 

 Ms. Lucy Lu had presented the applications of AES & Tof-SIMS

 

 Mr. Takuji Shibasaki introduced the failure analysis of electronic devices using scanning XPS Microprobe & AES