News & Events

International Symposium on Advanced Functional and Computational Materials 2017 was successfully held in Shenzhen from 7th to 8th January this year. This conference was organized by Tsinghua-Berkeley Shenzhen Institute and Graduate School of Shenzhen Tsinghua University. This international conference attracted more than two hundred academic specialists, experts, professors and students from different regions such as China, the United States, Japan and Hong Kong, etc. It investigates the development of advanced functional materials and calculating materials through the perspectives of academic and industrial and combined both for a promotion of continued industrial development.   This is the first time for Tsinghua-Berkeley Shenzhen Institute to organize an international conference. It has already raised the public awareness and passionate participation before the conference. It is a great platform for different regional intelligent experts to communicate and cooperate in order to propel the application process of advanced industrial materials and calculating materials. CoreTech Integrated Limited as PHI in China was so honored to be one of the exhibitors of the conference. CoreTech had successfully raised the professional expert and professor’s awareness on the Surface Analysis Techniques including XPS, AES and Tof-SIMS. Senior Sales Manager Lucy has explained and presented the functions and characteristics of XPS to the experts and professors. She answered their questions one by one and enhanced the understandings in XPS in terms of the wide range of possible applications.   CoreTech sets up a booth at the conference   The venue of International Symposium on Advanced Functional and Computational Materials 2017

Our newsletter Vol. 0051 -  CoreTech Website's Newest function - Technical Video is released now!     You may read the full version either by accessing Technical Info > Newsletter or click here!

The 3rd Asian Clay Conference (ACC-2016) was successfully held in Guangzhou on 18th to 20th November this year. This conference was organized by Guangzhou Institute of Geochemistry, Chinese Academy of Sciences with the co-organizers including Southwest University of Science and Technology, Chinese Society For Mineralogy Petrology and Geochemistry ,National Natural Science Foundation of China and Guangzhou Association for Science and Technology etc.   In this international conference, there were about 250 honored guests from around hundreds of popular university and science organization. CoreTech Integrated Limited was so honored to be one of the exhibitors of the conference. The theme of the conference this year is “Small Size, Big Science”. The genesis and transformation of clay minerals, geochemical processes and biochemical interactions concerning clay minerals are the main topics of the conference. CoreTech successfully raised the professional expert and professor’s awareness on TOF-SIMS. Senior Sales Manager Lucy has explained the functions and characteristics of TOP-SIMS. It drew interests of geologists, chemists and biologists.   This is the golden opportunity to let CoreTech being invited to be one of the exhibitors this year. This international conference is a great learning platform for us to communicate and interact with different experts, professors and students. We were so glad to present our newest products and raise the brand awareness of CoreTech.   CoreTech sets up a booth at the conference   Senior Sales Manager Lucy from CoreTech has explained the characteristics of TOP-SIMS to the experts and professors

To all the teachers, specialists and users:   CoreTech is going to have a Webinar on the Instrument.com.cn. The speaker is Wensly Yip from our company. The Webinar is about Easy Peak Identification for TOF-SIMS Molecular Imaging by Simultaneous Tandem MS Imaging. Please feel free to join the Webinar.   The details of the Webinar are as below: 　　　　　　　　　　　　　　　　　　　Date: 02 December, 2016 (Friday) 　　　　　　　　　　　　　　　　　　　Time: 10:00 am to 11:30 am 　　　　　　　　　　　　　　　　　　　Topic: Easy Peak Identification for TOF-SIMS Molecular Imaging by Simultaneous Tandem MS Imaging   Webinar description: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is widely used in industrial fields such as impurity analysis of semiconductors, analysis of high technology micro scale materials, and mass spectrometry of polymer and organic materials. Despite dramatic improvements in surface sensitivity and the resulting measureable spatial resolution, the unique identification of each detected mass peak within the mixture of additives and polymer compositions on the surface of real polymer samples has remained problematic. In order to solve this problem, we have developed the TOF-SIMS instrument equipped with tandem MS (MS/MS), and applied it to the various kinds of organic materials. From simplified MS/MS spectrum, the spectrum interpretation is much easier than before. In this tutorial, we will introduce our unique instrument, and demonstrate its capabilities.   If you are interested, please feel free to join the Webinar at http://www.instrument.com.cn/webinar/meeting/meetingInsidePage/2218.   CoreTech Integrated Limited ULVAC-PHI Incorporated

2016 ULVAC-PHI International Sales Meeting was successfully held from 11th to 14th October this year. This sales meeting is held biennially for the entire sales teams from all around the world. This year, the sales team members from Europe, United States, Korea, Russia, Malaysia, Philippine and Hong Kong all have joint together. In the conference, ULVAC-PHI gave the recognition to CoreTech team for the outstanding work performance. CoreTech was one of the most diligent sales agents in Asia in the past years. We were so honored to receive the reward from ULVAC-PHI.   Award from ULVAC-PHI   Group photo of ULVAC-PHI International Sales Meeting

Secondary ion mass spectrometry (SIMS) is a technique of instrument used to analyze the composition of solid surfaces and thin films. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an important surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. Also, it is a very sensitive surface analysis technology that accurately determines the composition of the sample surface elements.Through the analysis of the molecular ion peaks and functional fragments, it can be more convenient to ensure the surface compounds and structures of samples after the techniques of scanning and stripping the sample surface. The sample surface or even three-dimensional composition diagram can be got with higher analysis accuracy.   The 6th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS) is successfully held by the key laboratory of Chinese Academy of Science. This is from 8th to 11th October in Dalian Institute of Chemical Physics of Chinese Academy Of Science this year. More than 100 surface analysis specialists from the overseas and local specialists interested on Secondary Ion Mass Spectrometry joined the conference.   SIMS is an international conference which invited around one hundred SIMS researchers including local and foreign experts. Professor Ian Gilmore (President of SIMS last year) from the National Physical Laboratory, Professor Andrew Ewing from University of Gothenburg and Professor Jiro Matsuo from Kyoto University were invited to the conference. Apart from that, the Professor Shyue Jing-Jong from Academia Sinica, Dr. ShinIchi lida from ULVAC-PHI and Wensly Yip from CoreTech Integrated Limited have done some excellent presentations to all the specialists in order to raise the discussion in the perspectives of SIMS instrument investigation and theory development. Professor Shyue Jing-Jong from Academia Sinica has presented the topic as “Depth profiling of soft materials with cluster-atomic ion co-sputter”. Mr. Wensly Ip from CoreTech has presented the topic as “Analyzer Acceptance Angle & The Advent of 3D Chemical and Molecular Imaging by FIB-TOF Tomography” and Dr. ShinIchi lida has presented the topic as “Easy Compound Identification in TOF-SIMS By using Parallel Imaging MS/MS”. It raised the awareness and discussion from the participants.   This conference provided a platform to let CoreTech and the other specialists to have the technical exchange, academic investigation and further cooperation. This international conference is a great learning platform for us to communicate and interact with different experts, professors and students. We were so glad to know more about the future development trend and the customers’ needs of Secondary ion mass spectrometry.   Venue of The 6th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS)   CoreTech China Executive Director Mr. Wensly Yip had given a talk to the audiences   Dr. ShinIchi lida had given a talk to the audiences

Suzhou Institute of Nano-Tech and Nano-Bionics (SINANO) Open house is successfully held in September this year. SINANO is set up by the Chinese Academy of Science. Chinese Academy of Science is an important standard in the academic field of China. In this Open house, SINANO mentioned that it bought a new machine from ULVAC-PHI and they hoped it could demonstrate its capabilities.   The joined parties included Wintech Nano-Technology Services, Baosteel, Enkris Semiconductor, Dalian University of Technology, Shanghai Normal University and around 50 teachers and students from Sinano. The participants interacted and discussed about the new development of XPS. Professor Li-Zhangping from Tsinghua University, Professor Shyue-Jingjong from Taiwan Academia Sinica and Mr. Wensly Yip from CoreTech and Professor Urushihara Nobuaki from ULVAC-PHI were honored to be invited to make a brilliant talk.   2016 Sinano Open House   Wensly Ip had given a talk to the audiences.   Professor Urushihara Nobuaki from ULVAC-PHI had given a talk to the audiences.

2016 China National Surface Analysis Conference is held on 11th to 12th August in Kunming this year. More than 100 surface analysis specialists joined the conference.    CoreTech China Executive Director Mr. Wensly Yip and Mr. Takuya Miyayama from ULVAC-PHI have presented the new products and techniques in the conference. The Managing Director of CoreTech Dr. Huck Chen was also interviewed by the editor from instrument.com.cn. Mr. Wensly Ip from CoreTech has presented the topic as “The study of how primary beam affect the analysis result is surface analysis” and Mr. Takuya Miyayama has presented the topic as “Introducing the newest MS/MS capability in the Time-of-flight SIMS’’.     Related News: Instrument.com.cn   2016全国表面分析会议召开 应用领域与技术不断拓展 http://www.instrument.com.cn/news/20160815/199180.shtml   “让用户满意最重要”——访高德英特公司总经理陈文征博士 http://www.instrument.com.cn/news/20160810/198895.shtml   Group photo of 2016 China National Surface Analysis Conference Grand Opening.   The Managing Director of CoreTech Dr. Huck Chen had given a talk to the audiences.   CoreTech China Executive Director Mr. Wensly Yip had given a talk to the audiences.   Mr. Takuya Miyayama from ULVAC-PHI had given a talk to the audiences.

In August, CoreTech and ULVAC-PHI have held a press release for the new products of XPS before 2016 China Applied and Academic User meeting of Surface Analysis. More than 50 users of ULVAC-PHI and some professional on investigating surface analysis techniques were invited to the user meeting.CoreTech is the representative of ULVAC-PHI in the region of China. CoreTech and ULVAC-PHI have been started the cooperated relationship from 2007. CoreTech has 8 advanced service engineers now and they are all qualified to provide the best service with comprehensive problem-solving solutions.During the speech of the Executive Managing Director of ULVAC-PHI Mr. Ichiro Kimura and the Managing Director of CoreTech Dr. Huck Chen, both of them expressed that ULVAC-PHI is up together with Coretech as an union to work in the China market. CoreTech has acted as the role of PHI in China for many years. They do appreciate the user’s comments on ULVAC-PHI’s instruments and services and hope to reinforce the user’s communication and interaction through this platform. In the user meeting, CoreTech and ULVAC-PHI presented the sincere thanks and gratitude to Mr. Cao Lili and Mr. Liu Chinghua from Tsinghua University who have made contributions and supported Phi instruments for 20 years.CoreTech China Executive Director Wensly Yip presented the new product, technique and application with two specialists from ULVAC-PHI in the press release. He introduced the new released product of XPS, which is the PHI 5000 VersaProbe III. This is a multi-functional instrument of XPS. Last but not least, Ulvac- Phi has also released a new MS/MS technique which could be implemented in PHI nano TOF II.   Related News: Instrument.com.cn 高德英特与ULVAC-PHI在用户会上推出XPS重量级新品   CoreTech China Executive Director Mr. Wensly Yip had given a talk to the audiences   Mr. Ichiro Kimura from ULVAC-PHI had given a talk to the audiences

(This page is in Chinese only.  For details, please kindly contact our representative.)   致各位老师、专家和单位人员：   PHI公司于30多年前进入中国，衷心感谢清华大学曹立礼老师和刘庆华老师当时的鼎力支持，使PHI在中国取得了第一次的成功，并为日后的发展奠下了重要的基石。多年过去了，PHI从美国公司到现在日美合并的ULVAC-PHI，在中国的发展经历过高潮与低谷，也经过了不短的一段空窗期。在2007年，通过在东南亚市场的密切合作，高德公司与Ulvac-Phi公司建立了战略合作伙伴关系，并且双方对于中国区业务的发展前景有着共同的期待和展望。在2010年1月1日，高德公司以“PHI在中国”的身份正式的在北京成立公司，旨在帮助广大中国用户更高效地使用ULVAC-PHI仪器，发挥仪器的最大功用，并推动相关科研工作的发展。在高德公司不懈地努力和各位老师及用户们的鼎力支持下，Ulvac-Phi在中国区业务逐渐摆脱了业务低迷的局面，重新一步一步的赢回了市场份额和用户的信任。   2016年将是高德公司和ULVAC-PHI中国区业务发展的关键一年。高德公司与ULVAC-PHI公司共同计划在中国区再一次举办ULVAC-PHI用户交流会，希望借此机会把Ulvac-Phi最新表面分析技术和应用介绍给广大用户和听取用户们对于表面分析应用最新的需求，同时也希望借此机会把所有表面分析的新老用户聚合起来，打造一个技术交流和共享的平台，更好地为广大用户提供服务。现就有关事项安排如下：   一、会议形式及内容 仪器使用和数据处理培训班 用户邀请报告 ULVAC-PHI表面分析技术最新发展和应用   二、重要时间、地点和会议安排 2016年8月8日、9日 -  昆明文汇酒店 全天报到 2016年8月9日　　-  昆明理工大学分析测试研究中心201室 　　　　　　　　2:30pm to 5:30pm　-　XPS 和AES仪器使用和数据处理培训班 2016年8月10日　-　昆明理工大学管经学院MBA中心502室 　　　　　　　　08:30am　-　用户会议致辞 　　　　　　　　08:40am　-　PHI在中国和全球的最新动态 　　　　　　　　09:00am　-　PHI 在XPS的最新发展方向和应用 　　　　　　　　09:30am　-　用户邀请报告 1 　　　　　　　　10:00am　-　小息时间 　　　　　　　　10:20am　-　PHI在AES仪器的最新发展和应用 　　　　　　　　10:40am　-　用户邀请报告 2 　　　　　　　　11:10am　-　PHI在Tof-SIMS的最新突破性发展 　　　　　　　　11:30am　-　午餐休息 　　　　　　　　12:15pm　-　合照 　　　　　　　　01:30pm　-　用户讨论交流 　　　　　　　　06:00pm　-　晚宴   三、会议收费 和 住宿安排 会议参会免费,并招待用餐。住宿统一安排于昆明文汇酒店, 住宿费用自理。 文汇酒店地址：昆明市五华区学府路253号（昆明理工大学莲华校区）    四、联系方式                               联系人：凌媚（手机 186 1249 8200，邮箱 may.ling@coretechint.com） 　　　　潘剑南（手机 186 1230 078，邮箱 nice.pan@coretechint.com) 公司电话：010-62519668 公司传真：010-62513509   欢迎各位老师、专家和单位人员，报名参会。 附件一：《高德公司 邀请函》附件二：《报名表》 请将填妥报名报发送至may.ling@coretechint.com。   高德英特（北京）科技有限公司 Ulvac-Phi Incorporated