News & Events

The third lesson of "PHI CHINA Surface Analysis Technology Online Lecture – XPS" had been released yesterday (February 13) at 15:00.  The topic of this lesson was "XPS data interpretation and how to use MultiPak".  This lecture presented by Ms Lu Defeng, Senior Application Expert of PHI CHINA.  With plenty of experience in the industry, she shared the features of XPS atlas with the participants and showed how to use the MultiPak software for data processing.  For those questions raised online, she provided detailed answers patiently, which let the audiences had more specific and deeper understanding to the practical application of data processing in photoelectron spectroscopy.   Up to today, the online lecture series has finished three lectures, which are “XPS/UPS/LEIPS fundamental review and technologies features with applications”, “XPS instrumentation, sample preparation and transportation” and “XPS data interpretation and how to use MultiPak”.  The last lesson “XPS instrument daily maintenance & troubleshooting” will start on February 14,  15:00.    ★To avoid missing the live, please follow our Wechat account, click on “Technical Information – Online Lecture” and join the online lecture.  Let’s follow “PHI-CHINA” and learn together!   To review Q & A, you may access Technical Info > Application Notes   You may watch back the video by accessing Technical Info > Technical video

After the first online lesson of "PHI CHINA Surface Analysis Technology Online Lecture – XPS" released successfully through the network platform on February 11, PHI CHINA started the second online lecture at 15:00 on February 12th.  The topic of this lecture is “XPS instrumentation, sample preparation and transportation”. The presenter was Mr Wensly Yip Sheungyuen, General Manager of PHI CHINA. Mr. Yip gave a detailed explanation on the structure of photoelectron spectroscopy instrument, sample preparation and transmission operation, etc. during the course which lasted for around 1.5 hours.  After the lecture, he also answered questions which brought up by the audience participated in the lecture online.   The topic of this online lecture series consists of four courses, “XPS/UPS/LEIPS fundamental review and technologies features with applications”, “XPS instrumentation, sample preparation and transportation”, “XPS data interpretation and how to use MultiPak” and “XPS instrument daily maintenance & troubleshooting”.  The four-day (February 11-14) special online course will implement over the internet platform. The following is the schedule:     ★To avoid missing the live, please follow our Wechat account, click on “Technical Information – Online Lecture” and join the online lecture.  Let’s follow “PHI-CHINA” and learn together!   To review Q & A, you may access Technical Info > Application Notes   You may watch back the video by accessing Technical Info > Technical video

Under the critical period of COVID-2019, PHI CHINA is doing our best to follow Government policy and performing epidemic prevention measures. At the same time, PHI CHINA utilizes internet resource to start an online training course for our users at 15:00 on February 11, 2020. The course conducts professional theoretical knowledge training for our users, so to achieve both “Overcoming the epidemic” and “Improving the capabilities” under current situation.   “PHI CHINA Surface Analysis Technology Online Lecture – XPS”, the topic of this online lecture series, consists of “XPS/UPS/LEIPS fundamental review and technologies features with applications”, “XPS instrumentation, sample preparation and transportation”, “XPS data interpretation and how to use MultiPak” and “XPS instrument daily maintenance & troubleshooting”. These four courses will take 4 days (February 11-14, 2020) and implement over the internet platform.     The first lecture started yesterday and performed by Dr. Ju Huanxin, the Application Specialist of PHI CHINA, explained the basic principles of photoelectron spectroscopy.  After a brief introduction of ULVAC-PHI and PHI CHINA, Dr. Ju focused on the XPS/UPS/LEIPS fundamental review and technologies features with applications and provided detailed explanation.  After the online lecture, Dr. Ju answered the questions raised by the audience clearly.   Over 500 users from universities and industries joined this online lecture.  We received positive response from users on this online training style.  PHI CHINA will adhere to the original intention of providing high-quality services to users.  During the epidemic prevention and control period, we will continue to provide high-quality services through various channels.  We target to work with everyone to bring the PHI XPS instrument into full play and further promote the application and development of surface analysis technology.   PHI-CHINA invited participants to the PHI Nanjing Laboratory for on-site visits. Everyone discussed on instruments and analysis methods. The establishment of PHI Nanjing Lab will further improve our service and promote the development of surface analysis technology through cooperation with users.   Visible is light, invisible is power   During this critical period, PHI CHINA will obey the orders, build confidence, stick on our duties and strengthen business learning in order to complete our work with a higher standard and provide better quality services to our customers.   ★ Q & A will share with everyone afterwards.  Let’s learn and discuss together! ★ To avoid missing the live, please follow our Wechat account, click on “Technical Information – Online Lecture” and join the online lecture.  Let’s follow “PHI-CHINA” and learn together!   To review Q & A, you may access Technical Info > Application Notes   You may watch back the video by accessing Technical Info > Technical video

In recent years, with the rapid development of science and technology, advanced surface analysis technology has become an essential technology for studying the surface characteristics in fields of materials, energy, catalysis, microelectronics, the semiconductor industry, and the steel industry. ULVAC-PHI has a 50-year history in surface analysis, focusing on the technology development of high surface sensitivities, high energy resolution and high spatial resolution. It has developed a series of surface analysis equipment with unique technical advantages, including X-ray photoelectron spectroscopy (XPS), Inverse Photo-electron Spectroscopy (IPES), Auger electron spectroscopy (AES), time-of-flight secondary ion mass spectrometry (Tof-SIMS), and tandem mass spectrometry (Tandem MS / MSMS), etc. These analytical devices provide key information on elemental composition, chemical state, and electronic structure, and play an important role in surface characteristics studies and material/device performance enhancement.   On December 15th, 2018, ULVAC-PHI and PHI China / CoreTech Integrated Limited had successfully held the " Latest Method and Application of Surface Analysis Seminar and PHI Nanjing Laboratory Founding Conference" on the bank of Nanjing Baijia Lake. The Seminar invited more than 50 participants, coming from Tsinghua University, Nanjing University, Southeast University, Northwest University, Northwest Normal University, Shanghai Normal University, Shanghai Jiaotong University, Nanjing University of Science and Technology, Kunming University of Science and Technology, Beijing Institute of Technology, Yangzhou University, Taiwan Academia Sinica, CAS Institute of Chemistry, Shanghai Institute of Applied Physics, Center for High Pressure Science &Technology Advanced Research, Tianmu Lake Institute of Advanced Energy Storage Technologies and Bekaert Asia R&D Center. In this seminar, ULVAC-PHI Asia Manager Mr. Nobuaki Urushihara, PHI-China Executive Director Mr. Wensly Yip and application scientist Dr. Huanxin Ju gave a detailed report on the development and application of surface analysis methods. And Teacher Wenqing Yao and Teacher Zhanping Li from the Analysis Center of Tsinghua University and Professor Jing-Jong Shyue from the Academia Sinica of Taiwan were invited to give reports on the application of ULVAC-PHI analytical equipment in the field of surface/interface structure characterization, pharmacological active ingredient analysis, optoelectronic device preparation and failure analysis.   PHI-CHINA invited participants to the PHI Nanjing Laboratory for on-site visits. Everyone discussed on instruments and analysis methods. The establishment of PHI Nanjing Lab will further improve our service and promote the development of surface analysis technology through cooperation with users.   Group photo   Executive Director of PHI (China) Mr. Wensly Yip had given a talk to the audiences

PHI China / CoreTech Integrated Limited would like to congratulate to the Guangdong Province Analysis Testing & Surface Analysis committee in the well organizing the yearly meeting for 2018 alongside with the Surface Analysis Seminar. The host for this year meeting is CAS Guangzhou Institute of Energy Research and the venue is at the city of Gaomin in Guangzhou.   In this yearly meeting and Seminar, several professors and teachers had given their most recent research in the solar cell, perovskite or OLED related applications. From PHI China, our executive director, Mr. Wensly Yip had given a talk on the “Insitu XPS-UPS-IPES-GCIB Analysis Instrument – PHI 5000 VersaProbe III”. This technique is able to provide information from core level to fermi level including valence band (HOMO) and conduction band (LUMO) hence be able to directly give the bandgap information without any indirect assumption. Furthermore, GCIB sputtering at the insitu position extends its possibilities to a multi-layer XPS-UPS-IPES analysis.   ULVAC-PHI as the only manufacturer who made a full series of surface analysis machines including XPS, AES, Tof-SIMS and Dynamic SIMS, had always put the target to provide the most innovative instrument fitting for the world’s needs.   A Group photo taken during the Seminar

The show “Analytica China (International Trade Fair for Laboratory Technology, Analysis, Biotechnology and Diagnostics)” is a bi-yearly event which originated from Munich, Germany. This is the largest show exhibition in China on the laboratory instrument trade fair.   PHI China / CoreTech Integrated Limited had participated in this year fair at the booth number E3.3528. Executive Director Mr. Wensly Yip, Mr. William Zhang and Ms. May Ling from PHI China also join the event. Alongside with us, ULVAC-PHI Mr. Takuji Shibasaki had also joint in the fair.   We have showed at our booth the fully automated XPS instrument PHI X-tool as the world first touch panel software control XPS system. Along, we have also showed our newest development in other XPS model of systems, Auger machine and Tof-SIMS instruments.   Thousands of people had joint in this show and as the sole representative for ULVAC-PHI in China, CoreTech Integrated Limited / PHI China will continue to make our brand name more well-known with good reputation.   Left>right: Mr. Takuji Shibasaki, Mr. Wensly Yip, Mr. William Zhang, Ms. May Ling. Photo taken at the PHI China / CoreTech Integrated Limited booth during the Analytica Show, Shanghai 2019-November

PHI China / CoreTech Integrated Limited and ULVAC-PHI had started to do an expert return visit to our customers for improving our user experience from 2018 Winter time. Mr. Minoru Kodama from ULVAC-PHI and Mr. Guoqiang Xin had spent over 2 weeks to visit to our different customers to discuss with them about their valuable feedback of our surface analysis instrument. At the same time, Mr. Minoru Kodama had support to confirm the instruments are all running in the greatest shape and performance.   During the visit, Kodama-San (Japanese way as Mr. Kodama) together with Guoqiang also spent good time with our customers in exchanging idea on our instrument design, operation and application. PHI China / CoreTech Integrated Limited and ULVAC-PHI will continue to work as ONE team to provide to the surface analysis system users a better instrument together with even better after-sale service.   Short bio of Mr. Minoru Kodama: Kodama-San joint ULVAC-PHI in the year of 2004. He was a member of ULVAC-PHI R&D department for many years and was involved in customized instrumentation, design of equipment, production and products improvement. He has full knowledge of the PHI XPS system in both hardware and software. From 2018, Kodama-San started to join the International Service Support team. The purpose for this team is very straight forward in ULVAC-PHI, as to confirm all of our users are using the PHI’s instrument with the greatest satisfaction.   Photo taken with user Ms. Shi XiaoXia when Kodama-San visited to NanJing University.   Photo taken when Kodama-San visited to NorthWest University with user Ms. Ding ZhiQin and Ms. Wen XiaoQin   Kodama-San Visited to Hube University of Technology, and taken a photo with the user Teacher Li Jian and PHI China engineer Mr. Tao Zhijie

In sending a most sincere congratulate and regards from PHI China / CoreTech Integrated Limited for a very successful NMSSA meeting held by host NUS and co-host Suda University and Nanjing University in Suzhou, China 2018 October.   NMSSA this year had grown to receive a record high number of participates. Over 250 people joint from all over the world with hot discussion on the newest surface analysis technologies and its applications.   PHI China / CoreTech Integrated Limited alongside with ULVAC-PHI had join in this event and ever since its first held in Beijing, we had participated in this event every single year since more than 10 years ago. This time, ULVAC-PHI had presented in this meeting the newest LEIPS (Low Energy Inverse Photo-electron Spectroscopy) technique by Dr. Hsunyun Chang. This technique is built-in insitu together inside the PHI 5000 VersaProbe III multi-technique instrument. It allows the same analysis spot for performing XPS-UPS-IPES analysis and even could extend this to a deeper layer by Argon ion gun or GCIB (Gas Cluster Ion Beam) sputtering depth profile. This leads to a great interest in the world popular Solar cell, perovskite, OLED…etc types of applications.   ULVAC-PHI and PHI China / CoreTech Integrated Limited also had sponsored the conference grand opening dinner banquet, which ended with a very joyful atmosphere with all the important participates from China and all over the world.   A Group photo taken during NMSSA meeting   Meeting opening banquet dinner

PHI China / CoreTech Integrated Limited was being invited to participate in the CHInano and gave a talk in the workshop held by WinTech Nano (Suzhou) Limited. As the theme of the workshop, Analysis Testing Application, our executive director Mr. Wensly Yip had given a talk on the topic of “Commercialize XPS instrument combining both Soft and Hard Focus X-ray Source”. Such system, as model name PHI Quantes, utilize a dual monochromator for producing the 2 types of the scanning X-ray including Al K-Alpha X-ray and Cr K-Alpha X-ray. Both types of X-ray are in tens micron of spatial resolution with imaging capabilities. When these two X-ray combines into one system, it immediately gives to researcher a flexible way for detection depth. This eliminates the problem for many analysis that the samples putting in for analysis had already have too thick of the surface contamination which in a result no useful data can be produced.   PHI China / CoreTech Integrated Limited is the sole representative for ULVAC-PHI in China and had been in this position since 2009. We have always been continuously trying our best to promote the best surface analysis instrument from ULVAC-PHI and provide the best after-sale services to all the surface analysis instrument users.   Dinner banquet at the CHInano

PHI China / CoreTech Integrated Limited would like to congratulate the successfully held of the SIMS China conference, which host by SINANO and took place at the city of Suzhou, China in 2018 October. SIMS China is an event organized every 2 years. It was originally started by Prof. Jia Liang Zhen, our well-known SIMS mentor from Tsinghua University.   In this year SIMS China conference, ULVAC-PHI Mr. Nobuaki Urushihara, Mr. Takuji Shibasaki, Dr. Hsunyun Chang and Dr. Shinichi Iida together with PHI-USA Dr. Ashley Ellsworth had joint into the event. From PHI China / CoreTech Integrated Limited, executive director Mr. Wensly Yip, Ms. May Ling, Mr. William Zhang and Mr. Riky Zhu had joint the event. Dr. Ashley Ellsworth from PHI-USA had given a very interesting talk on “Using TOF-SIMS Tandem MS Imaging to Characterize Organic and Inorganic Materials: Two Case Studies” with one of the case example talked about an Amazonian damselfly wing. On combining a newly developed tandem mass technology, it brings to Tof-SIMS another breakthrough in the biological field once again.   Over the years, SIMS had become a very powerful analysis technique in the world which provide very useful information to the researchers. In China, SIMS society had also grown into one of the biggest group in the world. A record high number of participates had joint to the International SIMS conference in Poland in year 2017. We believe that SIMS technology will continue to play more important role for China market while also China will become one of the most important market for SIMS too.   PHI China / CoreTech Integrated Limited is the only Surface Analysis instruments manufacturer in the world who made a full series of products including XPS, AES, Tof-SIMS and Dynamic-SIMS, had been a regular sponsor for this event.   Group photo during SIMS China, Suzhou.   Dr. Ashley Ellsworth provided a talk showing the strength of tandem MS on Tof-SIMS   From left to right: Dr. Shinichi Iida, Mr. Nobuaki Urushihara, Dr. Ashley Ellsworth, Mr. Takuji Shibasaki, Dr. Hsunyun Chang, Mr. Wensly Yip, Mr. William Zhang Photo taken at Suzhou, China during the SIMS conference