News & Event

Secondary ion mass spectrometry (SIMS) is a technique of instrument used to analyze the composition of solid surfaces and thin films. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is an important surface-sensitive analytical method that uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface of the sample. Also, it is a very sensitive surface analysis technology that accurately determines the composition of the sample surface elements.Through the analysis of the molecular ion peaks and functional fragments, it can be more convenient to ensure the surface compounds and structures of samples after the techniques of scanning and stripping the sample surface. The sample surface or even three-dimensional composition diagram can be got with higher analysis accuracy.

The 6th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS) is successfully held by the key laboratory of Chinese Academy of Science. This is from 8th to 11th October in Dalian Institute of Chemical Physics of Chinese Academy Of Science this year. More than 100 surface analysis specialists from the overseas and local specialists interested on Secondary Ion Mass Spectrometry joined the conference.

SIMS is an international conference which invited around one hundred SIMS researchers including local and foreign experts. Professor Ian Gilmore (President of SIMS last year) from the National Physical Laboratory, Professor Andrew Ewing from University of Gothenburg and Professor Jiro Matsuo from Kyoto University were invited to the conference. Apart from that, the Professor Shyue Jing-Jong from Academia Sinica, Dr. ShinIchi lida from ULVAC-PHI and Wensly Yip from CoreTech Integrated Limited have done some excellent presentations to all the specialists in order to raise the discussion in the perspectives of SIMS instrument investigation and theory development. Professor Shyue Jing-Jong from Academia Sinica has presented the topic as “Depth profiling of soft materials with cluster-atomic ion co-sputter”. Mr. Wensly Ip from CoreTech has presented the topic as “Analyzer Acceptance Angle & The Advent of 3D Chemical and Molecular Imaging by FIB-TOF Tomography” and Dr. ShinIchi lida has presented the topic as “Easy Compound Identification in TOF-SIMS By using Parallel Imaging MS/MS”. It raised the awareness and discussion from the participants.

This conference provided a platform to let CoreTech and the other specialists to have the technical exchange, academic investigation and further cooperation. This international conference is a great learning platform for us to communicate and interact with different experts, professors and students. We were so glad to know more about the future development trend and the customers’ needs of Secondary ion mass spectrometry.

Venue of The 6th Chinese National Conference on Secondary Ion Mass Spectrometry (SIMS)

CoreTech China Executive Director Mr. Wensly Yip had given a talk to the audiences

Dr. ShinIchi lida had given a talk to the audiences