News & Event
28
NOV
2022
Tof-SIMS application series II in Optoelectronic device
18
NOV
2022
2022 Seminar on Surface Analysis Technology and Application was successfully held
17
OCT
2022
Two more AES have been installed
13
OCT
2022
Tof-SIMS application series in Optoelectronic device
03
OCT
2022
Characterizing transparent metal-state thin-film (TCO) by XPS, UPS and LEIPS
09
SEP
2022
Evaluation of sp2/sp3 carbon content in DLC films by XPS and REELS
16
AUG
2022
Reliable Bandgap Characterization with UPS/LEIPS and REELS
08
AUG
2022
Appreciation of PHI TOF-SIMS User Achievements - School of Materials Science and Engineering, Beijing Institute of Technology
29
JUL
2022
Appreciation of PHI XPS User Achievements - Institute of Materials for Energy and Environment, Qingdao University
22
JUL
2022
A Brief Discussion on Auger Electron Spectroscopy
